Role of O2 radicals on silicone plasma treatments for a-Si:H surface passivation of PV wafers bonded to glass

Stefano Nicola Granata, Alessio Marchegiani, Twan Bearda, Loic Tous, David Cheyns, Yaser Abdulraheem, Ivan Gordon, Jozef Szlufcik, Robert Mertens, Jef Poortmans

Research output: Contribution to journalArticlepeer-review

Abstract

Argon (Ar) and oxygen (O2) plasmas are performed on silicone adhesives to eliminate the negative influence of silicone on amorphous silicon (a-Si:H) surface passivation of wafers bonded to glass. Both the Ar and O2 plasmas lead to oxidation of the silicone surface, consisting in an increase of oxygen/carbon ratio, of degree of crosslinking, and of material density. The oxidized silicone is more resilient than pristine and does not interact with the a-Si:H passivation process, allowing for state-of-the-art surface passivation of wafers bonded to glass. Similarities between the modifications induced by the Ar and O2 plasmas on the silicone indicate the secondary role of the O2 radicals in the oxidation process. Moreover, amorphous/crystalline heterojunction interdigitated back contact solar cells (a-Si:H/c-Si HJ i-BC) are fabricated on freestanding and bonded wafers treated with Ar plasma. The devices show comparable open-circuit voltages of up to 675 mV, confirming at device level the efficacy of the treatment.

Original languageEnglish
Pages (from-to)1946-1953
Number of pages8
JournalPhysica Status Solidi (A) Applications and Materials Science
Volume212
Issue number9
DOIs
StatePublished - 1 Sep 2015

Keywords

  • amorphous silicon
  • plasma treatment
  • polydimethylsiloxane
  • surface passivation

Funding Agency

  • Kuwait Foundation for the Advancement of Sciences

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