Abstract
Abstract In the future solar devices will be manufactured onto thin mono-crystalline silicon wafers (foils) potentially bonded to substrate carriers. In this study, the influence of the substrate carrier potential (grounded or floating) on the amorphous silicon a-Si:H surface passivation of the bonded foil is discussed for the cases of conductive and insulating substrate carriers. A conductive carrier leads to an increase in deposition rate and ion bombardment energy, which is detrimental for sample lifetime. An insulating carrier, e.g., a glass substrate, inverts the trend and improves the a-Si:H surface passivation.
| Original language | English |
|---|---|
| Article number | 34124 |
| Pages (from-to) | 9-13 |
| Number of pages | 5 |
| Journal | Thin Solid Films |
| Volume | 579 |
| DOIs | |
| State | Published - 31 Mar 2015 |
Keywords
- Amorphous silicon
- Heterojunctions
- PECVD
- Plasma potential
- Silicon solar cells
- Surface passivation
- Thin wafers
Funding Agency
- Kuwait Foundation for the Advancement of Sciences