TY - JOUR
T1 - Energy yield framework to simulate thin film CIGS solar cells and analyze limitations of the technology
AU - Ramesh, Santhosh
AU - Tuomiranta, Arttu
AU - Yordanov, Georgi H.
AU - Badran, Hussein
AU - Hajjiah, Ali
AU - Vermang, Bart
AU - Poortmans, Jef
N1 - Publisher Copyright:
© The Author(s) 2025.
PY - 2025/12
Y1 - 2025/12
N2 - This study presents a comprehensive evaluation of Copper Indium Gallium Selenide (CIGS) solar technology, benchmarked against crystalline silicon (c-Si) PERC PV technology. Utilizing a newly developed energy yield model, we analyzed the performance of CIGS in various environmental scenarios, emphasizing its behavior in low-light conditions and under different temperature regimes. The model demonstrated high accuracy with improved error metrics of normalized mean bias error (nMBE) ~ 1% and normalized root mean square error (nRMSE) of ~ 8%–20% in simulating rack mounted setup and integrated PV systems. Key findings reveal that the CIGS technology, while slightly underperforming in integrated, low-irradiance setups, shows comparable or superior performance to c-Si PERC technology in high-irradiance and high-temperature conditions. A significant focus of the study was on the low-light performance of CIGS, where it exhibited notable voltage losses. Our research highlights the importance of reducing the diode ideality factor for enhancing CIGS power conversion efficiency, particularly In low-light conditions. These insights provide a pathway for future research and technological improvements, emphasizing defect engineering, passivation strategies to advance the understanding and application of the CIGS technology.
AB - This study presents a comprehensive evaluation of Copper Indium Gallium Selenide (CIGS) solar technology, benchmarked against crystalline silicon (c-Si) PERC PV technology. Utilizing a newly developed energy yield model, we analyzed the performance of CIGS in various environmental scenarios, emphasizing its behavior in low-light conditions and under different temperature regimes. The model demonstrated high accuracy with improved error metrics of normalized mean bias error (nMBE) ~ 1% and normalized root mean square error (nRMSE) of ~ 8%–20% in simulating rack mounted setup and integrated PV systems. Key findings reveal that the CIGS technology, while slightly underperforming in integrated, low-irradiance setups, shows comparable or superior performance to c-Si PERC technology in high-irradiance and high-temperature conditions. A significant focus of the study was on the low-light performance of CIGS, where it exhibited notable voltage losses. Our research highlights the importance of reducing the diode ideality factor for enhancing CIGS power conversion efficiency, particularly In low-light conditions. These insights provide a pathway for future research and technological improvements, emphasizing defect engineering, passivation strategies to advance the understanding and application of the CIGS technology.
UR - http://www.scopus.com/inward/record.url?scp=85214197050&partnerID=8YFLogxK
U2 - 10.1038/s41598-024-78862-w
DO - 10.1038/s41598-024-78862-w
M3 - Article
AN - SCOPUS:85214197050
SN - 2045-2322
VL - 15
JO - Scientific Reports
JF - Scientific Reports
IS - 1
M1 - 988
ER -