Equipments Details
Description
The device is based on an optical nondestructive technique that allow characterization of thin films, surfaces, and interfaces. And is used to obtain thin films thickness, refractive index and optical loss constant at various wavelengths.
Details
| Name | Manfucturer |
|---|---|
| Acquisition date | 1/01/01 |
| Manufacturers | NANOFILM (Accurion) |
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