Equipments Details
Description
Atomic force microscope (AFM) probes the surface of a sample with a sharp tip, a couple of microns long and often less than 100Å in diameter. The insturment generates a 2D/3D view at atomic-scale resolution and can be used to study roughness of surface
Details
| Name | Manfucturer |
|---|---|
| Acquisition date | 1/01/01 |
| Manufacturers | Agilent Technologies |
×
![]()
Fingerprint
Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.